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Field Ion Microscopy formatIsbn:Softcover 9783642686894 zu folgenden Themen: Segmentierung 9783642096402 zu folgenden Themen: Segmentierung (2) knowledge based applications that will support the entire product development cycle Only when Turner et 3 al Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal
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Field-Ion Microscopy formatIsbn:Softcover - 9783642686894 zu folgenden Themen: Segmentierung 9783642096402

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